SPIE 2025 Chandra S. Vikram Award in Optical Metrology
I received the 2025 SPIE Chandra S. Vikram Award in Optical Metrology
"For lifetime achievement in optical metrology and optical testing, with pioneering contributions in speckle metrology, interferometry, phase measurement techniques, interferometer and algorithm developments".
Many thanks to SPIE and all my colleagues and students over the years.
Photos below :
• Being presented the award by 2025 SPIE President Peter de Groot
• With my former student Joanna Schmit who nominated me
• Me in my lab
Link to press release:
"Katherine Creath: The 2025 SPIE Chandra S. Vikram Award in Optical Metrology"
https://spie.org/news/katherine-creath-the-2025-spie-chandra-s-vikram-award-in-optical-metrology